Photon-Emission-Guided Laser Fault Injection Enables RP2350 Secure Debug

Researchers at the University of California, Berkeley, and the University of Michigan have developed a new method for securely debugging a processor called the RP2350. They used a technique called photon-emission-guided laser fault injection to inject faults into the processor, which allowed them to identify and fix bugs. The researchers used a laser to inject faults into the processor's circuitry, and a camera to detect the resulting photon emissions. This allowed them to pinpoint the location of the faults and debug the processor. The researchers believe this method could be used to debug other complex systems as well.